Jeol 2010 tem user manual

JEOL JEM Transmission Electron Microscope Operating Instructions 1. Login to microscope computer with your uniqname and Kerberos (level 1) password. 2. Turn on the two camera systems. Turn on power strip and side mount camera module. 3. Turn on second computer. Objective aperture Anti‐contamination device Specimen holder Pump/air switch. JEOL Basic operating instructions. May This manual contains information regarding the basic operation of this microscope for conventional imaging. These are the only procedures you should carry out, unless you have received specific additional training. The information contained in this manual is subject to change without notice. JEOL FasTEM DigitalMicrograph User's Guide Electron Microscopy Laboratory Instititute of Materials Science University of Connecticut The purpose of this manual is to remind you of the essential points covered in your training classes. The information contained herein is incomplete and NOT a substitute for familiarity with the.

Summary of Contents for JEOL JEMF. Page 1 INSTRUCTIONS JEMF FIELD EMISSION ELECTRON MICROSCOPE For the proper use of the instrument, be sure to read this instruction manual. Even after you read it, please keep the manual on hand so that you can consult it whenever necessary. IEMF-1 (). TFS HeliosCX DualBeam FIB-SEM with CRYO-Coming SOON. Transmission Electron Microscopy. FEI Tecnai G2 F20 Cryo FE-TEM. FEI Tecnai G2 F20 ST FE-TEM - Materials. JEOL EX TEM. JEOL JEM TEM (offline) Supporting Equipment. American Optical Heavy Duty Sliding Microtome. Cressington Sputter Coater. o JEOL PC: HT Status: ON, Emission Status: ON TEM Spot=1, Alpha=3 X=Y=Z=0, TX=0, TY=0 (double click Stage Neutral to return all coordinates to 0) BEAM VALVE: closed. Start-up. 1. If you are the first user of the day, take out ACD heater, fill the Anticontamination device (ACD) with LN. 2, and wait for 20 min. and then top off LN. 2. again. 2.

1. Guidelines JEM- The JEOL TEM is a sensitive instrument and requires delicate, responsible, and properly trained users in order to maintain high quality operation. The majority of problems with TEM are usually associated with poor or untrained usage. A few guidelines will ensure safe. JEOL F manual. They inconsistently refer to the second condenser lens as CL3, the third condenser lens, or CL2. This happened because the F manual is an expanded and modified manual, resulting in several inconsistencies. In this document, we will always refer to it as CL3, since that is the convention used by the JEOL service. The patented JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination. The standard incorporation of the objective mini lens means that Lorentz microscopy is a standard feature of this microscope.